Library Services | Technical University of Kenya Search for 'su:{Spectroscopy and Microscopy.}'

Time-Resolved Spectroscopy in Complex Liquids

By Torre, Renato.. Boston, MA : Springer US, 2007 9780387255583

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Scanning Probe Microscopy

By Kalinin, Sergei.. New York, NY : Springer New York, 2007 9780387286686

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Springer Handbook of Electronic and Photonic Materials

By Kasap, Safa.. Boston, MA : Springer US, 2007 9780387291857

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Springer Handbook of Lasers and Optics

By Träger, Frank.. New York, NY : Springer New York, 2007 9780387304205

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Light Scattering and Nanoscale Surface Roughness

By Maradudin, Alexei A.. Boston, MA : Springer US, 2007 9780387356594

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Scanning Probe Microscopy

By Foster, Adam.. New York, NY : Springer New York, 2006 9780387372310

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Atomistic and Continuum Modeling of Nanocrystalline Materials

By Cherkaoui, Mohammed.. Boston, MA : Springer US, 2009 9780387467719

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The gm/ID Methodology, A Sizing Tool for Low-voltage Analog CMOS Circuits

By Jespers, Paul.. Boston, MA : Springer US, 2010 9780387471013

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Fundamentals of Power Semiconductor Devices

By Baliga, B. Jayant.. Boston, MA : Springer US, 2008 9780387473147

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Science of Microscopy

By Hawkes, Peter W.. New York, NY : Springer New York, 2007 9780387497624

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Handbook of Molecular Force Spectroscopy

By Noy, Aleksandr.. Boston, MA : Springer US, 2008 9780387499895

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Polarization Effects in Semiconductors

By Wood, Colin.. Boston, MA : Springer US, 2008 9780387683195

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The Materials Science of Semiconductors

By Rockett, Angus.. Boston, MA : Springer US, 2008 9780387686509

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Physical Properties of Polymers Handbook

By Mark, James E.. New York, NY : Springer New York, 2007 9780387690025

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One-Dimensional Nanostructures

By Wang, Zhiming M.. New York, NY : Springer New York, 2008 9780387741321

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Physical Limitations of Semiconductor Devices

By Vashchenko, V. A.. Boston, MA : Springer US, 2008 9780387745145

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Advanced Power Rectifier Concepts

By Baliga, B. Jayant.. Boston, MA : Springer US, 2009 9780387755892

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Transmission Electron Microscopy

By Williams, David B.. Boston, MA : Springer US, 2009 9780387765013

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Photoemission from Optoelectronic Materials and their Nanostructures

By Ghatak, Kamakhya Prasad.. New York, NY : Springer US, 2009 9780387786063

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Phase Change Materials

By Raoux, Simone.. Boston, MA : Springer US, 2009 9780387848747

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Nanoscale Magnetic Materials and Applications

By Liu, J. Ping.. Boston, MA : Springer US, 2009 9780387856001

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Principles and Applications of ESR Spectroscopy

By Lund, Anders.. Dordrecht : Springer Netherlands, 2011 9781402053443

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Supramolecular Structure and Function 9

By Pifat-Mrzljak, Greta.. Dordrecht : Springer Netherlands, 2007 9781402064661

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ESD Protection Device and Circuit Design for Advanced CMOS Technologies

By Semenov, Oleg.. Dordrecht : Springer Netherlands, 2008 9781402083013

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Microscopy of Semiconducting Materials 2007

By Cullis, A. G.. Dordrecht : Springer Netherlands, 2008 9781402086151

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TiO2 Nanotube Arrays

By Grimes, Craig A.. Boston, MA : Springer US, 2009 9781441900685

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Strain Effect in Semiconductors

By Sun, Yongke.. Boston, MA : Springer US, 2010 9781441905529

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Cellular Nanoscale Sensory Wave Computing

By Baatar, Chagaan.. Boston, MA : Springer US, 2010 9781441910110

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Technology of Quantum Devices

By Razeghi, Manijeh.. Boston, MA : Springer US, 2010 9781441910561

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Reviews in Fluorescence 2008

By Geddes, Chris D.. New York, NY : Springer New York, 2010 9781441912602

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Fundamentals of III-V Semiconductor MOSFETs

By Oktyabrsky, Serge.. Boston, MA : Springer US, 2010 9781441915474

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Advanced Power MOSFET Concepts

By Baliga, B. Jayant.. Boston, MA : Springer US, 2010 9781441959171

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Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces

By Walkosz, Weronika.. New York, NY : Springer New York, 2011 9781441978172

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Characterization of Terahertz Emission from High Resistivity Fe-doped Bulk Ga0.69In0.31As Based Photoconducting Antennas

By Sengupta, Suranjana.. New York, NY : Springer New York, 2011 9781441981981

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Pharmaceutical Microscopy

By Carlton, Robert Allen.. New York, NY : Springer New York, 2011 9781441988317

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Electron Energy-Loss Spectroscopy in the Electron Microscope

By Egerton, R.F.. Boston, MA : Springer US, 2011 9781441995834

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Reviews in Fluorescence 2009

By Geddes, Chris D.. New York, NY : Springer New York, 2011 9781441996725

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Medical Image Processing

By Dougherty, Geoff.. New York, NY : Springer New York, 2011 9781441997791

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Mono-Cycle Photonics and Optical Scanning Tunneling Microscopy

By Yamashita, Mikio.. Berlin, Heidelberg : Springer Berlin Heidelberg, 2005 9783540271406

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Applied Scanning Probe Methods II

By Bhushan, Bharat.. Berlin, Heidelberg : Springer Berlin Heidelberg, 2006 9783540274537

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Microscopy of Semiconducting Materials

By Cullis, A. G.. Berlin, Heidelberg : Springer Berlin Heidelberg, 2005 9783540319153

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Coherent Semiconductor Optics

By Meier, Torsten.. Berlin, Heidelberg : Springer Berlin Heidelberg, 2007 9783540325550

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Applied Scanning Probe Methods V

By Bhushan, Bharat.. Berlin, Heidelberg : Springer Berlin Heidelberg, 2007 9783540373162

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High Power Laser-Matter Interaction

By Mulser, Peter.. Berlin, Heidelberg : Springer Berlin Heidelberg, 2010 9783540460657

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Wide Bandgap Semiconductors

By Takahashi, Kiyoshi.. Berlin, Heidelberg : Springer Berlin Heidelberg, 2007 9783540472353

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Theoretical Surface Science

By Groß, Axel.. Berlin, Heidelberg : Springer Berlin Heidelberg, 2009 9783540689690

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Optical Imaging and Microscopy

By Török, Peter.. Berlin, Heidelberg : Springer Berlin Heidelberg, 2007 9783540695653

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Lithium Niobate

By Volk, Tatyana.. Berlin, Heidelberg : Springer Berlin Heidelberg, 2009 9783540707660

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Organic Nanostructures for Next Generation Devices

By Al-Shamery, Katharina.. Berlin, Heidelberg : Springer Berlin Heidelberg, 2008 9783540719236

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Transparent Conductive Zinc Oxide

By Ellmer, Klaus.. Berlin, Heidelberg : Springer Berlin Heidelberg, 2008 9783540736127

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