<![CDATA[Library Services | Technical University of Kenya Search for 'au:"Wang, Patrick S. P."']]>

<![CDATA[Library Services | Technical University of Kenya Search for 'au:"Wang, Patrick S. P."']]> http://library.tukenya.ac.ke/cgi-bin/koha/opac-search.pl?q=ccl=au%3A%22Wang%2C%20Patrick%20S.%20P.%22&format=rss2 2 0 50 Pattern Recognition, Machine Intelligence and Biometrics ISBN 9783642224072 http://library.tukenya.ac.ke/cgi-bin/koha/opac-detail.pl?biblionumber=85400 By Wang, Patrick S. P.. Berlin, Heidelberg : Springer Berlin Heidelberg, 2011 9783642224072

Place Hold on Pattern Recognition, Machine Intelligence and Biometrics

]]> http://library.tukenya.ac.ke/cgi-bin/koha/opac-detail.pl?biblionumber=85400 Pattern Recognition, Machine Intelligence and Biometrics ISBN 9783642224072 http://library.tukenya.ac.ke/cgi-bin/koha/opac-detail.pl?biblionumber=108188 By Wang, Patrick S. P.. . 800p. 100 illus., 10 illus. in color. 9783642224072

Place Hold on Pattern Recognition, Machine Intelligence and Biometrics

]]> http://library.tukenya.ac.ke/cgi-bin/koha/opac-detail.pl?biblionumber=108188