<![CDATA[Library Services | Technical University of Kenya Search for 'au:"Walkosz, Weronika."']]>

<![CDATA[Library Services | Technical University of Kenya Search for 'au:"Walkosz, Weronika."']]> http://library.tukenya.ac.ke/cgi-bin/koha/opac-search.pl?q=ccl=au%3A%22Walkosz%2C%20Weronika.%22&format=rss2 2 0 50 Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces ISBN 9781441978172 http://library.tukenya.ac.ke/cgi-bin/koha/opac-detail.pl?biblionumber=73452 By Walkosz, Weronika.. New York, NY : Springer New York, 2011 9781441978172

Place Hold on Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces

]]> http://library.tukenya.ac.ke/cgi-bin/koha/opac-detail.pl?biblionumber=73452 Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces ISBN 9781441978172 http://library.tukenya.ac.ke/cgi-bin/koha/opac-detail.pl?biblionumber=105866 By Walkosz, Weronika.. . XIV, 110 p. 9781441978172

Place Hold on Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces

]]> http://library.tukenya.ac.ke/cgi-bin/koha/opac-detail.pl?biblionumber=105866