<![CDATA[Library Services | Technical University of Kenya Search for 'au:"Ibe, Eishi H."']]>

<![CDATA[Library Services | Technical University of Kenya Search for 'au:"Ibe, Eishi H."']]> http://library.tukenya.ac.ke/cgi-bin/koha/opac-search.pl?q=ccl=au%3A%22Ibe%2C%20Eishi%20H.%22&format=rss2 2 0 50 Dependability in Electronic Systems ISBN 9781441967152 http://library.tukenya.ac.ke/cgi-bin/koha/opac-detail.pl?biblionumber=73200 By Kanekawa, Nobuyasu.. New York, NY : Springer New York, 2011 9781441967152

Place Hold on Dependability in Electronic Systems

]]> http://library.tukenya.ac.ke/cgi-bin/koha/opac-detail.pl?biblionumber=73200 Dependability in Electronic Systems ISBN 9781441967152 http://library.tukenya.ac.ke/cgi-bin/koha/opac-detail.pl?biblionumber=105632 By Kanekawa, Nobuyasu.. . X, 240p. 100 illus. 9781441967152

Place Hold on Dependability in Electronic Systems

]]> http://library.tukenya.ac.ke/cgi-bin/koha/opac-detail.pl?biblionumber=105632