Normal view MARC view ISBD view

Model-Driven Testing [electronic resource] / by Paul Baker, Zhen Ru Dai, Jens Grabowski, Øystein Haugen, Ina Schieferdecker, Clay Williams.

By: Baker, Paul.
Contributor(s): Dai, Zhen Ru | Grabowski, Jens | Haugen, Øystein | Schieferdecker, Ina | Williams, Clay | SpringerLink (Online service).
Material type: materialTypeLabelBookPublisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2008Description: digital.ISBN: 9783540725633.Subject(s): Computer science | Software engineering | Information Systems | Computer Science | Software Engineering | Management of Computing and Information SystemsDDC classification: 005.1 Online resources: Click here to access online In: Springer eBooks
Tags from this library: No tags from this library for this title. Log in to add tags.
No physical items for this record

There are no comments for this item.

Log in to your account to post a comment.

2017 | The Technical University of Kenya Library | +254(020) 2219929, 3341639, 3343672 | library@tukenya.ac.ke | Haile Selassie Avenue