Lifetime Spectroscopy [electronic resource] : A Method of Defect Characterization in Silicon for Photovoltaic Applications / by Stefan Rein.
By: Rein, Stefan.
Contributor(s): SpringerLink (Online service).
Material type:
BookSeries: Springer Series in Material Science, 85.Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2005Description: digital.ISBN: 9783540279228.Subject(s): Physics | Particles (Nuclear physics) | Optical materials | Physics | Solid State Physics and Spectroscopy | Optical and Electronic MaterialsDDC classification: 530.41 Online resources: Click here to access online
In:
Springer eBooks
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