Normal view MARC view ISBD view

Advanced Computing in Electron Microscopy [electronic resource] / by Earl J. Kirkland.

By: Kirkland, Earl J.
Contributor(s): SpringerLink (Online service).
Material type: materialTypeLabelBookPublisher: Boston, MA : Springer US, 2010Description: digital.ISBN: 9781441965332.Subject(s): Computer engineering | Surfaces (Physics) | Materials Science | Characterization and Evaluation of Materials | Electrical EngineeringDDC classification: 620.11 Online resources: Click here to access online In: Springer eBooks
Tags from this library: No tags from this library for this title. Log in to add tags.
No physical items for this record

There are no comments for this item.

Log in to your account to post a comment.

2017 | The Technical University of Kenya Library | +254(020) 2219929, 3341639, 3343672 | library@tukenya.ac.ke | Haile Selassie Avenue