CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies [electronic resource] : Process-Aware SRAM Design and Test / by Andrei Pavlov, Manoj Sachdev.
By: Pavlov, Andrei.
Contributor(s): Sachdev, Manoj | SpringerLink (Online service).
Material type: BookSeries: Frontiers In Electronic Testing, 40.Publisher: Dordrecht : Springer Netherlands, 2008Description: digital.ISBN: 9781402083631.Subject(s): Engineering | Memory management (Computer science) | Systems engineering | Engineering | Circuits and Systems | Memory StructuresDDC classification: 621.3815 Online resources: Click here to access online In: Springer eBooksNo physical items for this record
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