Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections [electronic resource] / by Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou.
By: Tan, Cher Ming.
Contributor(s): Li, Wei | Gan, Zhenghao | Hou, Yuejin | SpringerLink (Online service).
Material type:
BookSeries: Springer Series in Reliability Engineering.Publisher: London : Springer London, 2011Edition: 1.Description: digital.ISBN: 9780857293107.Subject(s): Engineering | Differential equations, partial | System safety | Electronics | Optical materials | Engineering | Quality Control, Reliability, Safety and Risk | Computational Intelligence | Electronics and Microelectronics, Instrumentation | Optical and Electronic Materials | Partial Differential EquationsDDC classification: 658.56 Online resources: Click here to access online
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