Normal view MARC view ISBD view

fault-tolerance and reliability techniques for high density: random access memories/ kanad.. chakraborty

By: "chakraborty, kanad . ".
Material type: materialTypeLabelBookPublisher: new delhi : prentice hall 2002Edition: ed.Description: "xix, 426p.; 24 cm.".ISBN: 81-203-2214-2.
Tags from this library: No tags from this library for this title. Log in to add tags.
Item type Current location Call number Status Notes Date due Item holds
General Circulation Books General Circulation Books General Stacks TK7895.M4.C44 2002 (Browse shelf) Available B.K.O-OLD LIB
Total holds: 0

includes bibliography

There are no comments for this item.

Log in to your account to post a comment.

2017 | The Technical University of Kenya Library | +254(020) 2219929, 3341639, 3343672 | library@tukenya.ac.ke | Haile Selassie Avenue