Lock-in Thermography [electronic resource] : Basics and Use for Evaluating Electronic Devices and Materials / by Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp.
By: Breitenstein, Otwin [author.].
Contributor(s): Warta, Wilhelm [author.] | Langenkamp, Martin [author.] | SpringerLink (Online service).
Material type:
BookSeries: Springer Series in Advanced Microelectronics: 10Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2010Description: X, 258 p. online resource.Content type: text Media type: computer Carrier type: online resourceISBN: 9783642024177.Subject(s): Physics | Engineering | Materials | Surfaces (Physics) | Physics | Optics, Optoelectronics, Plasmonics and Optical Devices | Characterization and Evaluation of Materials | Engineering, general | Structural MaterialsDDC classification: 621.36 Online resources: Click here to access online Introduction -- Physical and Technical Basics -- Timing Strategies -- Heat Dissipation Mechanisms in Solar Cells -- Carrier Density Imaging -- Illuminated Lock-in Thermography (ILIT) -- Experimental Technique -- Theory -- Measurement Strategies -- Typical Applications -- Summary and Outlook.
This book deals with lock-in thermography (LIT) as a special active dynamic variant of the well-known IR thermography. It enables a much improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. The book concentrates on applications to electronic devices and materials, but the basic chapters are useful as well for non-destructive evaluation. Various experimental approaches to LIT are reviewed with special emphasis to different available commercial LIT systems. New LIT applications are reviewed, like Illuminated LIT applied to solar cells , and non-thermal LIT lifetime mapping. Typical LIT investigation case studies are introduced.
There are no comments for this item.