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Advanced Computing in Electron Microscopy [electronic resource] / by Earl J. Kirkland.

By: Kirkland, Earl J [author.].
Contributor(s): SpringerLink (Online service).
Material type: materialTypeLabelBookPublisher: Boston, MA : Springer US, 2010Description: X, 289p. 250 illus., 125 illus. in color. online resource.Content type: text Media type: computer Carrier type: online resourceISBN: 9781441965332.Subject(s): Computer engineering | Surfaces (Physics) | Materials Science | Characterization and Evaluation of Materials | Electrical EngineeringDDC classification: 620.11 Online resources: Click here to access online
Contents:
The Transmission Electron Microscope -- Linear Image Approximations -- Sampling and the Fast Fourier Transform -- Calculation of Images of Thin Specimens -- Theory of Calculation of Images of Thick Specimens -- Multislice Applications and Examples -- The Programs -- Plotting Transfer Functions -- The Fourier Projection Theorem -- Atomic Potentials and Scattering Factors -- Bilinear Interpolation -- 3D Perspective View.
In: Springer eBooksSummary: Advanced Computing in Electron Microscopy, 2nd Edition, brings together diverse information on image simulation. An invaluable resource, this book provides information on various methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. This text will serve as a great tool for students at the advanced undergraduate or graduate level, as well as experienced researchers in the field. This enhanced second edition includes: -descriptions of new developments in the field -updated references -additional material on aberration corrected instruments and confocal electron microscopy -expanded and improved examples and sections to provide stronger clarity
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The Transmission Electron Microscope -- Linear Image Approximations -- Sampling and the Fast Fourier Transform -- Calculation of Images of Thin Specimens -- Theory of Calculation of Images of Thick Specimens -- Multislice Applications and Examples -- The Programs -- Plotting Transfer Functions -- The Fourier Projection Theorem -- Atomic Potentials and Scattering Factors -- Bilinear Interpolation -- 3D Perspective View.

Advanced Computing in Electron Microscopy, 2nd Edition, brings together diverse information on image simulation. An invaluable resource, this book provides information on various methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. This text will serve as a great tool for students at the advanced undergraduate or graduate level, as well as experienced researchers in the field. This enhanced second edition includes: -descriptions of new developments in the field -updated references -additional material on aberration corrected instruments and confocal electron microscopy -expanded and improved examples and sections to provide stronger clarity

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