Progress in VLSI Design and Test [electronic resource] : 16th International Symposium, VDAT 2012, Shibpur, India, July 1-4, 2012. Proceedings / edited by Hafizur Rahaman, Sanatan Chattopadhyay, Santanu Chattopadhyay.
By: Rahaman, Hafizur [editor.].
Contributor(s): Chattopadhyay, Sanatan [editor.] | Chattopadhyay, Santanu [editor.] | SpringerLink (Online service).
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BookSeries: Lecture Notes in Computer Science: 7373Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2012Description: XXIV, 408 p. 275 illus. online resource.Content type: text Media type: computer Carrier type: online resourceISBN: 9783642314940.Subject(s): Computer science | Logic design | Computer Communication Networks | Software engineering | Data structures (Computer science) | Computer software | Computer Science | Logic Design | Software Engineering/Programming and Operating Systems | Computer Communication Networks | Data Structures, Cryptology and Information Theory | Algorithm Analysis and Problem Complexity | Programming TechniquesDDC classification: 621.395 Online resources: Click here to access online
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Springer eBooksSummary: This book constitutes the refereed proceedings of the 16th International Symposium on VSLI Design and Test, VDAT 2012, held in Shibpur, India, in July 2012. The 30 revised regular papers presented together with 10 short papers and 13 poster sessions were carefully selected from 135 submissions. The papers are organized in topical sections on VLSI design, design and modeling of digital circuits and systems, testing and verification, design for testability, testing memories and regular logic arrays, embedded systems: hardware/software co-design and verification, emerging technology: nanoscale computing and nanotechnology.
This book constitutes the refereed proceedings of the 16th International Symposium on VSLI Design and Test, VDAT 2012, held in Shibpur, India, in July 2012. The 30 revised regular papers presented together with 10 short papers and 13 poster sessions were carefully selected from 135 submissions. The papers are organized in topical sections on VLSI design, design and modeling of digital circuits and systems, testing and verification, design for testability, testing memories and regular logic arrays, embedded systems: hardware/software co-design and verification, emerging technology: nanoscale computing and nanotechnology.
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