Entry Topical Term

Number of records used in: 1

001 - CONTROL NUMBER

• control field: 19205

003 - CONTROL NUMBER IDENTIFIER

• control field: KEPU

005 - DATE AND TIME OF LATEST TRANSACTION

• control field: 20120123153731.0

008 - FIXED-LENGTH DATA ELEMENTS

• fixed length control field: 120123|||a|||||| | ||| d

040 ## - CATALOGING SOURCE

• Original cataloging agency: KEPU
• Transcribing agency: KEPU

150 ## - HEADING--TOPICAL TERM

• Topical term or geographic name as entry element: Materials
• General subdivision: Defects
• General subdivision: Congresses.

670 ## - SOURCE DATA FOUND

• Source citation: Work cat.: (KEPU)28991: International Conference on the Science and Technology of Defect Control in Semiconductors (1989 : Yokohama-shi, Japan) 19203, Defect control in semiconductors :, 1990.