Transmission Electron Microscopy and Diffractometry of Materials (Record no. 96936)

000 -LEADER
fixed length control field 03431nam a22005415i 4500
001 - CONTROL NUMBER
control field 978-3-642-29761-8
003 - CONTROL NUMBER IDENTIFIER
control field DE-He213
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20140220082847.0
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr nn 008mamaa
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 121025s2013 gw | s |||| 0|eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9783642297618
-- 978-3-642-29761-8
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.1007/978-3-642-29761-8
Source of number or code doi
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number QC450-467
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number QC718.5.S6
072 #7 - SUBJECT CATEGORY CODE
Subject category code PNFS
Source bicssc
072 #7 - SUBJECT CATEGORY CODE
Subject category code PDND
Source bicssc
072 #7 - SUBJECT CATEGORY CODE
Subject category code SCI078000
Source bisacsh
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.36
Edition number 23
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Fultz, Brent.
Relator term author.
245 10 - TITLE STATEMENT
Title Transmission Electron Microscopy and Diffractometry of Materials
Medium [electronic resource] /
Statement of responsibility, etc by Brent Fultz, James Howe.
250 ## - EDITION STATEMENT
Edition statement 4th ed. 2013.
264 #1 -
-- Berlin, Heidelberg :
-- Springer Berlin Heidelberg :
-- Imprint: Springer,
-- 2013.
300 ## - PHYSICAL DESCRIPTION
Extent XX, 761 p. 470 illus.
Other physical details online resource.
336 ## -
-- text
-- txt
-- rdacontent
337 ## -
-- computer
-- c
-- rdamedia
338 ## -
-- online resource
-- cr
-- rdacarrier
347 ## -
-- text file
-- PDF
-- rda
490 1# - SERIES STATEMENT
Series statement Graduate Texts in Physics,
International Standard Serial Number 1868-4513
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note Diffraction and X-Ray Powder Diffractometer Problems -- TEM and its Optics Problems -- Neutron Scattering Problems -- Scattering Problems -- Inelastic Electron Scattering and Spectroscopy Problems -- Diffraction from Crystals Sphere Problems -- Electron Diffraction and Crystallography Problems -- Diffraction Contrast in TEM Images Problems -- Diffraction Lineshapes Problems -- Patterson Functions and Diffuse Scattering Problems -- High-Resolution TEM Imaging Problems -- High-Resolution STEM and Related Imaging Techniques Problems -- Dynamical Theory Problems.
520 ## - SUMMARY, ETC.
Summary, etc This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Physics.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Spectroscopy.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Surfaces (Physics).
650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Physics.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Spectroscopy and Microscopy.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Characterization and Evaluation of Materials.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Spectroscopy/Spectrometry.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Surfaces and Interfaces, Thin Films.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Surface and Interface Science, Thin Films.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Howe, James.
Relator term author.
710 2# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element SpringerLink (Online service)
773 0# - HOST ITEM ENTRY
Title Springer eBooks
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Display text Printed edition:
International Standard Book Number 9783642297601
830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE
Uniform title Graduate Texts in Physics,
-- 1868-4513
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier http://dx.doi.org/10.1007/978-3-642-29761-8
912 ## -
-- ZDB-2-PHA

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