Transmission Electron Microscopy and Diffractometry of Materials (Record no. 96936)
[ view plain ]
000 -LEADER | |
---|---|
fixed length control field | 03431nam a22005415i 4500 |
001 - CONTROL NUMBER | |
control field | 978-3-642-29761-8 |
003 - CONTROL NUMBER IDENTIFIER | |
control field | DE-He213 |
005 - DATE AND TIME OF LATEST TRANSACTION | |
control field | 20140220082847.0 |
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION | |
fixed length control field | cr nn 008mamaa |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
fixed length control field | 121025s2013 gw | s |||| 0|eng d |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
International Standard Book Number | 9783642297618 |
-- | 978-3-642-29761-8 |
024 7# - OTHER STANDARD IDENTIFIER | |
Standard number or code | 10.1007/978-3-642-29761-8 |
Source of number or code | doi |
050 #4 - LIBRARY OF CONGRESS CALL NUMBER | |
Classification number | QC450-467 |
050 #4 - LIBRARY OF CONGRESS CALL NUMBER | |
Classification number | QC718.5.S6 |
072 #7 - SUBJECT CATEGORY CODE | |
Subject category code | PNFS |
Source | bicssc |
072 #7 - SUBJECT CATEGORY CODE | |
Subject category code | PDND |
Source | bicssc |
072 #7 - SUBJECT CATEGORY CODE | |
Subject category code | SCI078000 |
Source | bisacsh |
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER | |
Classification number | 621.36 |
Edition number | 23 |
100 1# - MAIN ENTRY--PERSONAL NAME | |
Personal name | Fultz, Brent. |
Relator term | author. |
245 10 - TITLE STATEMENT | |
Title | Transmission Electron Microscopy and Diffractometry of Materials |
Medium | [electronic resource] / |
Statement of responsibility, etc | by Brent Fultz, James Howe. |
250 ## - EDITION STATEMENT | |
Edition statement | 4th ed. 2013. |
264 #1 - | |
-- | Berlin, Heidelberg : |
-- | Springer Berlin Heidelberg : |
-- | Imprint: Springer, |
-- | 2013. |
300 ## - PHYSICAL DESCRIPTION | |
Extent | XX, 761 p. 470 illus. |
Other physical details | online resource. |
336 ## - | |
-- | text |
-- | txt |
-- | rdacontent |
337 ## - | |
-- | computer |
-- | c |
-- | rdamedia |
338 ## - | |
-- | online resource |
-- | cr |
-- | rdacarrier |
347 ## - | |
-- | text file |
-- | |
-- | rda |
490 1# - SERIES STATEMENT | |
Series statement | Graduate Texts in Physics, |
International Standard Serial Number | 1868-4513 |
505 0# - FORMATTED CONTENTS NOTE | |
Formatted contents note | Diffraction and X-Ray Powder Diffractometer Problems -- TEM and its Optics Problems -- Neutron Scattering Problems -- Scattering Problems -- Inelastic Electron Scattering and Spectroscopy Problems -- Diffraction from Crystals Sphere Problems -- Electron Diffraction and Crystallography Problems -- Diffraction Contrast in TEM Images Problems -- Diffraction Lineshapes Problems -- Patterson Functions and Diffuse Scattering Problems -- High-Resolution TEM Imaging Problems -- High-Resolution STEM and Related Imaging Techniques Problems -- Dynamical Theory Problems. |
520 ## - SUMMARY, ETC. | |
Summary, etc | This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | Physics. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | Spectroscopy. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | Surfaces (Physics). |
650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | Physics. |
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | Spectroscopy and Microscopy. |
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | Characterization and Evaluation of Materials. |
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | Spectroscopy/Spectrometry. |
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | Surfaces and Interfaces, Thin Films. |
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | Surface and Interface Science, Thin Films. |
700 1# - ADDED ENTRY--PERSONAL NAME | |
Personal name | Howe, James. |
Relator term | author. |
710 2# - ADDED ENTRY--CORPORATE NAME | |
Corporate name or jurisdiction name as entry element | SpringerLink (Online service) |
773 0# - HOST ITEM ENTRY | |
Title | Springer eBooks |
776 08 - ADDITIONAL PHYSICAL FORM ENTRY | |
Display text | Printed edition: |
International Standard Book Number | 9783642297601 |
830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE | |
Uniform title | Graduate Texts in Physics, |
-- | 1868-4513 |
856 40 - ELECTRONIC LOCATION AND ACCESS | |
Uniform Resource Identifier | http://dx.doi.org/10.1007/978-3-642-29761-8 |
912 ## - | |
-- | ZDB-2-PHA |
No items available.