Debugging at the Electronic System Level (Record no. 113620)

000 -LEADER
fixed length control field 02720nam a22004335i 4500
001 - CONTROL NUMBER
control field 978-90-481-9255-7
003 - CONTROL NUMBER IDENTIFIER
control field DE-He213
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20140220084603.0
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr nn 008mamaa
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 100623s2010 ne | s |||| 0|eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9789048192557
-- 978-90-481-9255-7
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.1007/978-90-481-9255-7
Source of number or code doi
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number TK7888.4
072 #7 - SUBJECT CATEGORY CODE
Subject category code TJFC
Source bicssc
072 #7 - SUBJECT CATEGORY CODE
Subject category code TEC008010
Source bisacsh
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.3815
Edition number 23
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Rogin, Frank.
Relator term author.
245 10 - TITLE STATEMENT
Title Debugging at the Electronic System Level
Medium [electronic resource] /
Statement of responsibility, etc by Frank Rogin, Rolf Drechsler.
264 #1 -
-- Dordrecht :
-- Springer Netherlands :
-- Imprint: Springer,
-- 2010.
300 ## - PHYSICAL DESCRIPTION
Extent XVIII, 200p.
Other physical details online resource.
336 ## -
-- text
-- txt
-- rdacontent
337 ## -
-- computer
-- c
-- rdamedia
338 ## -
-- online resource
-- cr
-- rdacarrier
347 ## -
-- text file
-- PDF
-- rda
520 ## - SUMMARY, ETC.
Summary, etc Debugging becomes more and more the bottleneck to chip design productivity, especially while developing modern complex integrated circuits and systems at the Electronic System Level (ESL). Today, debugging is still an unsystematic and lengthy process. Here, a simple reporting of a failure is not enough, anymore. Rather, it becomes more and more important not only to find many errors early during development but also to provide efficient methods for their isolation. In Debugging at the Electronic System Level the state-of-the-art of modeling and verification of ESL designs is reviewed. There, a particular focus is taken onto SystemC. Then, a reasoning hierarchy is introduced. The hierarchy combines well-known debugging techniques with whole new techniques to improve the verification efficiency at ESL. The proposed systematic debugging approach is supported amongst others by static code analysis, debug patterns, dynamic program slicing, design visualization, property generation, and automatic failure isolation. All techniques were empirically evaluated using real-world industrial designs. Summarized, the introduced approach enables a systematic search for errors in ESL designs. Here, the debugging techniques improve and accelerate error detection, observation, and isolation as well as design understanding.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Engineering.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Computer science.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Systems engineering.
650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Engineering.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Circuits and Systems.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Processor Architectures.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Drechsler, Rolf.
Relator term author.
710 2# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element SpringerLink (Online service)
773 0# - HOST ITEM ENTRY
Title Springer eBooks
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Display text Printed edition:
International Standard Book Number 9789048192540
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier http://dx.doi.org/10.1007/978-90-481-9255-7
912 ## -
-- ZDB-2-ENG

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