Materials Science with Ion Beams (Record no. 111282)
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000 -LEADER | |
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fixed length control field | 03226nam a22004935i 4500 |
001 - CONTROL NUMBER | |
control field | 978-3-540-88789-8 |
003 - CONTROL NUMBER IDENTIFIER | |
control field | DE-He213 |
005 - DATE AND TIME OF LATEST TRANSACTION | |
control field | 20140220084521.0 |
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION | |
fixed length control field | cr nn 008mamaa |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
fixed length control field | 100301s2010 gw | s |||| 0|eng d |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
International Standard Book Number | 9783540887898 |
-- | 978-3-540-88789-8 |
024 7# - OTHER STANDARD IDENTIFIER | |
Standard number or code | 10.1007/978-3-540-88789-8 |
Source of number or code | doi |
050 #4 - LIBRARY OF CONGRESS CALL NUMBER | |
Classification number | QC770-798 |
072 #7 - SUBJECT CATEGORY CODE | |
Subject category code | PHP |
Source | bicssc |
072 #7 - SUBJECT CATEGORY CODE | |
Subject category code | SCI051000 |
Source | bisacsh |
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER | |
Classification number | 539.73 |
Edition number | 23 |
100 1# - MAIN ENTRY--PERSONAL NAME | |
Personal name | Bernas, Harry. |
Relator term | editor. |
245 10 - TITLE STATEMENT | |
Title | Materials Science with Ion Beams |
Medium | [electronic resource] / |
Statement of responsibility, etc | edited by Harry Bernas. |
264 #1 - | |
-- | Berlin, Heidelberg : |
-- | Springer Berlin Heidelberg, |
-- | 2010. |
300 ## - PHYSICAL DESCRIPTION | |
Other physical details | online resource. |
336 ## - | |
-- | text |
-- | txt |
-- | rdacontent |
337 ## - | |
-- | computer |
-- | c |
-- | rdamedia |
338 ## - | |
-- | online resource |
-- | cr |
-- | rdacarrier |
347 ## - | |
-- | text file |
-- | |
-- | rda |
490 1# - SERIES STATEMENT | |
Series statement | Topics in Applied Physics, |
International Standard Serial Number | 0303-4216 ; |
Volume number/sequential designation | 116 |
505 0# - FORMATTED CONTENTS NOTE | |
Formatted contents note | Fundamental Concepts of Ion-Beam Processing -- Precipitate and Microstructural Stability in Alloys Subjected to Sustained Irradiation -- Spontaneous Patterning of Surfaces by Low-Energy Ion Beams -- Ion-Beam-Induced Amorphization and Epitaxial Crystallization of Silicon -- Voids and Nanocavities in Silicon -- Damage Formation and Evolution in Ion-Implanted Crystalline Si -- Point Defect Kinetics and Extended-Defect Formation during Millisecond Processing of Ion-Implanted Silicon -- Magnetic Properties and Ion Beams: Why and How -- Structure and Properties of Nanoparticles Formed by Ion Implantation -- Metal Nanoclusters for Optical Properties -- Ion Beams in the Geological Sciences -- Ion-Beam Modification of Polymer Surfaces for Biological Applications. |
520 ## - SUMMARY, ETC. | |
Summary, etc | This book introduces materials scientists and designers, physicists and chemists to the properties of materials that can be modified by ion irradiation or implantation. These techniques can help design new materials or to test modified properties; novel applications already show that ion-beam techniques are complementary to others, yielding previously unattainable properties. Also, ion-beam interactions modify materials at the nanoscale, avoiding the often detrimental results of lithographic or chemical techniques. Here, the effects are related to better-known quasi-equilibrium thermodynamics, and the consequences to materials are discussed with concepts that are familiar to materials science. Examples addressed concern semiconductor physics, crystal and nanocluster growth, optics, magnetism, and applications to geology and biology. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | Physics. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | Particle acceleration. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | Engineering. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | Optical materials. |
650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | Physics. |
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | Particle Acceleration and Detection, Beam Physics. |
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | Condensed Matter Physics. |
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | Engineering, general. |
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | Optical and Electronic Materials. |
710 2# - ADDED ENTRY--CORPORATE NAME | |
Corporate name or jurisdiction name as entry element | SpringerLink (Online service) |
773 0# - HOST ITEM ENTRY | |
Title | Springer eBooks |
776 08 - ADDITIONAL PHYSICAL FORM ENTRY | |
Display text | Printed edition: |
International Standard Book Number | 9783540887881 |
830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE | |
Uniform title | Topics in Applied Physics, |
-- | 0303-4216 ; |
Volume number/sequential designation | 116 |
856 40 - ELECTRONIC LOCATION AND ACCESS | |
Uniform Resource Identifier | http://dx.doi.org/10.1007/978-3-540-88789-8 |
912 ## - | |
-- | ZDB-2-PHA |
No items available.