Materials Science with Ion Beams (Record no. 111282)

000 -LEADER
fixed length control field 03226nam a22004935i 4500
001 - CONTROL NUMBER
control field 978-3-540-88789-8
003 - CONTROL NUMBER IDENTIFIER
control field DE-He213
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20140220084521.0
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr nn 008mamaa
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 100301s2010 gw | s |||| 0|eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9783540887898
-- 978-3-540-88789-8
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.1007/978-3-540-88789-8
Source of number or code doi
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number QC770-798
072 #7 - SUBJECT CATEGORY CODE
Subject category code PHP
Source bicssc
072 #7 - SUBJECT CATEGORY CODE
Subject category code SCI051000
Source bisacsh
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 539.73
Edition number 23
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Bernas, Harry.
Relator term editor.
245 10 - TITLE STATEMENT
Title Materials Science with Ion Beams
Medium [electronic resource] /
Statement of responsibility, etc edited by Harry Bernas.
264 #1 -
-- Berlin, Heidelberg :
-- Springer Berlin Heidelberg,
-- 2010.
300 ## - PHYSICAL DESCRIPTION
Other physical details online resource.
336 ## -
-- text
-- txt
-- rdacontent
337 ## -
-- computer
-- c
-- rdamedia
338 ## -
-- online resource
-- cr
-- rdacarrier
347 ## -
-- text file
-- PDF
-- rda
490 1# - SERIES STATEMENT
Series statement Topics in Applied Physics,
International Standard Serial Number 0303-4216 ;
Volume number/sequential designation 116
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note Fundamental Concepts of Ion-Beam Processing -- Precipitate and Microstructural Stability in Alloys Subjected to Sustained Irradiation -- Spontaneous Patterning of Surfaces by Low-Energy Ion Beams -- Ion-Beam-Induced Amorphization and Epitaxial Crystallization of Silicon -- Voids and Nanocavities in Silicon -- Damage Formation and Evolution in Ion-Implanted Crystalline Si -- Point Defect Kinetics and Extended-Defect Formation during Millisecond Processing of Ion-Implanted Silicon -- Magnetic Properties and Ion Beams: Why and How -- Structure and Properties of Nanoparticles Formed by Ion Implantation -- Metal Nanoclusters for Optical Properties -- Ion Beams in the Geological Sciences -- Ion-Beam Modification of Polymer Surfaces for Biological Applications.
520 ## - SUMMARY, ETC.
Summary, etc This book introduces materials scientists and designers, physicists and chemists to the properties of materials that can be modified by ion irradiation or implantation. These techniques can help design new materials or to test modified properties; novel applications already show that ion-beam techniques are complementary to others, yielding previously unattainable properties. Also, ion-beam interactions modify materials at the nanoscale, avoiding the often detrimental results of lithographic or chemical techniques. Here, the effects are related to better-known quasi-equilibrium thermodynamics, and the consequences to materials are discussed with concepts that are familiar to materials science. Examples addressed concern semiconductor physics, crystal and nanocluster growth, optics, magnetism, and applications to geology and biology.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Physics.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Particle acceleration.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Engineering.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Optical materials.
650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Physics.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Particle Acceleration and Detection, Beam Physics.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Condensed Matter Physics.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Engineering, general.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Optical and Electronic Materials.
710 2# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element SpringerLink (Online service)
773 0# - HOST ITEM ENTRY
Title Springer eBooks
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Display text Printed edition:
International Standard Book Number 9783540887881
830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE
Uniform title Topics in Applied Physics,
-- 0303-4216 ;
Volume number/sequential designation 116
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier http://dx.doi.org/10.1007/978-3-540-88789-8
912 ## -
-- ZDB-2-PHA

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