Single-Photon Imaging (Record no. 107442)

000 -LEADER
fixed length control field 03722nam a22005415i 4500
001 - CONTROL NUMBER
control field 978-3-642-18443-7
003 - CONTROL NUMBER IDENTIFIER
control field DE-He213
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20140220083754.0
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr nn 008mamaa
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 110801s2011 gw | s |||| 0|eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9783642184437
-- 978-3-642-18443-7
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.1007/978-3-642-18443-7
Source of number or code doi
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number QC350-467
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number TA1501-1820
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number QC392-449.5
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number TA1750-1750.22
072 #7 - SUBJECT CATEGORY CODE
Subject category code TTB
Source bicssc
072 #7 - SUBJECT CATEGORY CODE
Subject category code PHJ
Source bicssc
072 #7 - SUBJECT CATEGORY CODE
Subject category code TEC030000
Source bisacsh
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.36
Edition number 23
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Seitz, Peter.
Relator term editor.
245 10 - TITLE STATEMENT
Title Single-Photon Imaging
Medium [electronic resource] /
Statement of responsibility, etc edited by Peter Seitz, Albert JP Theuwissen.
264 #1 -
-- Berlin, Heidelberg :
-- Springer Berlin Heidelberg,
-- 2011.
300 ## - PHYSICAL DESCRIPTION
Extent XVIII, 354 p.
Other physical details online resource.
336 ## -
-- text
-- txt
-- rdacontent
337 ## -
-- computer
-- c
-- rdamedia
338 ## -
-- online resource
-- cr
-- rdacarrier
347 ## -
-- text file
-- PDF
-- rda
490 1# - SERIES STATEMENT
Series statement Springer Series in Optical Sciences,
International Standard Serial Number 0342-4111 ;
Volume number/sequential designation 160
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note Fundamentals of noise in optoelectronics -- Semiconductor technology for single-photon image sensing -- Hybrid Avalanche Photodiode Array (APD) Imaging -- Electron Bombarded Semiconductor Image Sensors -- Silicon Photomultipliers, SiPM -- Electron-Multiplying CDs, EMCCD -- Monolithic Single-Photon Avalanche Photodetectors, SPAD -- Single-photon CMOS imaging through bandwidth optimization -- Architectures for low-noise CMOS electronic imaging -- Low-noise electronic imaging with double-gate FETs and charge-modulation devices -- Energy-sensitive single-photon X-ray and particle imaging -- Single-photon imaging for astronomy and aerospace applications -- Single-photon imaging for the life sciences -- Single-photon imaging for time-of-flight range 3D imaging.
520 ## - SUMMARY, ETC.
Summary, etc The acquisition and interpretation of images is a central capability in almost all scientific and technological domains. In particular, the acquisition of electromagnetic radiation, in the form of visible light, UV, infrared, X-ray, etc. is of enormous practical importance. The ultimate sensitivity in electronic imaging is the detection of individual photons. With this book, the first comprehensive review of all aspects of single-photon electronic imaging has been created. Topics include theoretical basics, semiconductor fabrication, single-photon detection principles, imager design and applications of different spectral domains. Today, the solid-state fabrication capabilities for several types of image sensors has advanced to a point, where uncoooled single-photon electronic imaging will soon become a consumer product. This book is giving a specialist´s view from different domains to the forthcoming “single-photon imaging” revolution. The various aspects of single-photon imaging are treated by internationally renowned, leading scientists and technologists who have all pioneered their respective fields.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Physics.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Microwaves.
650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Physics.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Optics, Optoelectronics, Plasmonics and Optical Devices.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Microwaves, RF and Optical Engineering.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Atomic, Molecular, Optical and Plasma Physics.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Spectroscopy and Microscopy.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Signal, Image and Speech Processing.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Theuwissen, Albert JP.
Relator term editor.
710 2# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element SpringerLink (Online service)
773 0# - HOST ITEM ENTRY
Title Springer eBooks
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Display text Printed edition:
International Standard Book Number 9783642184420
830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE
Uniform title Springer Series in Optical Sciences,
-- 0342-4111 ;
Volume number/sequential designation 160
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier http://dx.doi.org/10.1007/978-3-642-18443-7
912 ## -
-- ZDB-2-PHA

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