Nanotribology and Nanomechanics I (Record no. 107040)

000 -LEADER
fixed length control field 02566nam a22004335i 4500
001 - CONTROL NUMBER
control field 978-3-642-15283-2
003 - CONTROL NUMBER IDENTIFIER
control field DE-He213
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20140220083747.0
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr nn 008mamaa
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 110530s2011 gw | s |||| 0|eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9783642152832
-- 978-3-642-15283-2
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.1007/978-3-642-15283-2
Source of number or code doi
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number T174.7
072 #7 - SUBJECT CATEGORY CODE
Subject category code TDPB
Source bicssc
072 #7 - SUBJECT CATEGORY CODE
Subject category code TEC027000
Source bisacsh
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 620.5
Edition number 23
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Bhushan, Bharat.
Relator term editor.
245 10 - TITLE STATEMENT
Title Nanotribology and Nanomechanics I
Medium [electronic resource] :
Remainder of title Measurement Techniques and Nanomechanics /
Statement of responsibility, etc edited by Bharat Bhushan.
264 #1 -
-- Berlin, Heidelberg :
-- Springer Berlin Heidelberg :
-- Imprint: Springer,
-- 2011.
300 ## - PHYSICAL DESCRIPTION
Extent XVIII, 623p. 341 illus.
Other physical details online resource.
336 ## -
-- text
-- txt
-- rdacontent
337 ## -
-- computer
-- c
-- rdamedia
338 ## -
-- online resource
-- cr
-- rdacarrier
347 ## -
-- text file
-- PDF
-- rda
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note Introduction - Measurement Techniques and Applications -- Scanning Probe Microscopy - Principle of Operation, Instrumentation and Probes -- General and Special Probes in Scanning Microscopies -- Force Calibration Techniques for AFM Cantilevers -- Noncontact Atomic Force Microscopy and Related Topics -- Low Temperature Scanning Probe Microscopy -- Dynamic Modes of Atomic Force Microscopy -- Molecular Single Molecular Recognition Force Spectroscopy and Imaging -- Nanomechanical Properties of Solid Surfaces and Thin Films -- Computer Simulations of Nanometer-Scale Indentation and Friction.
520 ## - SUMMARY, ETC.
Summary, etc The comprehensive reference and textbook serves as a timely, practical introduction to the principles of nanotribology and nanomechanics. Assuming some familiarity with macroscopic tribology, the book comprises chapters by internationally recognized experts, who integrate knowledge of the field from the mechanics and materials-science perspectives. They cover key measurement techniques, their applications, and theoretical modelling of interfaces, each beginning their contributions with macro- and progressing to microconcepts.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Engineering.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Nanotechnology.
650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Engineering.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Nanotechnology and Microengineering.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Nanotechnology.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Nanoscale Science and Technology.
710 2# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element SpringerLink (Online service)
773 0# - HOST ITEM ENTRY
Title Springer eBooks
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Display text Printed edition:
International Standard Book Number 9783642152825
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier http://dx.doi.org/10.1007/978-3-642-15283-2
912 ## -
-- ZDB-2-ENG

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