Signal Measurement and Estimation Techniques for Micro and Nanotechnology (Record no. 106161)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 03426nam a22004815i 4500 |
| 001 - CONTROL NUMBER | |
| control field | 978-1-4419-9946-7 |
| 003 - CONTROL NUMBER IDENTIFIER | |
| control field | DE-He213 |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20140220083731.0 |
| 007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION | |
| fixed length control field | cr nn 008mamaa |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 110714s2011 xxu| s |||| 0|eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 9781441999467 |
| -- | 978-1-4419-9946-7 |
| 024 7# - OTHER STANDARD IDENTIFIER | |
| Standard number or code | 10.1007/978-1-4419-9946-7 |
| Source of number or code | doi |
| 050 #4 - LIBRARY OF CONGRESS CALL NUMBER | |
| Classification number | TJ210.2-211.495 |
| 050 #4 - LIBRARY OF CONGRESS CALL NUMBER | |
| Classification number | TJ163.12 |
| 072 #7 - SUBJECT CATEGORY CODE | |
| Subject category code | TJFM |
| Source | bicssc |
| 072 #7 - SUBJECT CATEGORY CODE | |
| Subject category code | TJFD |
| Source | bicssc |
| 072 #7 - SUBJECT CATEGORY CODE | |
| Subject category code | TEC004000 |
| Source | bisacsh |
| 072 #7 - SUBJECT CATEGORY CODE | |
| Subject category code | TEC037000 |
| Source | bisacsh |
| 082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 629.8 |
| Edition number | 23 |
| 100 1# - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Clévy, Cédric. |
| Relator term | editor. |
| 245 10 - TITLE STATEMENT | |
| Title | Signal Measurement and Estimation Techniques for Micro and Nanotechnology |
| Medium | [electronic resource] / |
| Statement of responsibility, etc | edited by Cédric Clévy, Micky Rakotondrabe, Nicolas Chaillet. |
| 264 #1 - | |
| -- | New York, NY : |
| -- | Springer New York, |
| -- | 2011. |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | X, 242p. 155 illus. |
| Other physical details | online resource. |
| 336 ## - | |
| -- | text |
| -- | txt |
| -- | rdacontent |
| 337 ## - | |
| -- | computer |
| -- | c |
| -- | rdamedia |
| 338 ## - | |
| -- | online resource |
| -- | cr |
| -- | rdacarrier |
| 347 ## - | |
| -- | text file |
| -- | |
| -- | rda |
| 505 0# - FORMATTED CONTENTS NOTE | |
| Formatted contents note | Microscale Specificities -- Observer Techniques Applied to the Control of Piezoelectric Microactuators -- Measurement and Control for High-Speed Sub-Atomic Positioning in Scanning Probe Microscopes -- Microrobotic tools for the measurement of small forces -- Distinguishing Healthy and Defective Oocytes during Intracytoplasmic Sperm Injection -- In situ Characterizations of Thin-film Nanostructures with Large-range Direct Force Sensing -- A mechanism approach for enhancing the dynamic range and linearity of MEMS Optical Force Sensing -- Observer-based estimation of weak forces in a nanosystem measurement device. |
| 520 ## - SUMMARY, ETC. | |
| Summary, etc | Signal Measurement and Estimation Techniques for Micro and Nanotechnology discusses micro, nano and robotic cells and gives a state-of-the-art presentation of the different techniques and solutions to measure and estimate signals at the micro and nano scale. New technologies and applications such as micromanipulation (artificial components, biological objects), micro-assembly (MEMS, MOEMS, NEMS) and material and surface force characterization are covered. The importance of sensing at the micro and nano scale is presented as a key issue in control systems, as well as for understanding the physical phenomena of these systems. This book also: Explains issues that make signal measurement and estimation techniques difficult at the micro-nano-scale and offers solutions Discusses automated micro-assembly, and control of micro-nano robotic devices Presents and links signal measurement and estimation techniques for micro-nano scale systems with microfabrication methods, sensors integration and control schemes Signal Measurement and Estimation Techniques for Micro and Nanotechnology is a must-read for researchers and engineers working in MEMS and control systems. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name as entry element | Engineering. |
| 650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name as entry element | Engineering. |
| 650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name as entry element | Control, Robotics, Mechatronics. |
| 650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name as entry element | Nanotechnology and Microengineering. |
| 650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name as entry element | Signal, Image and Speech Processing. |
| 700 1# - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Rakotondrabe, Micky. |
| Relator term | editor. |
| 700 1# - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Chaillet, Nicolas. |
| Relator term | editor. |
| 710 2# - ADDED ENTRY--CORPORATE NAME | |
| Corporate name or jurisdiction name as entry element | SpringerLink (Online service) |
| 773 0# - HOST ITEM ENTRY | |
| Title | Springer eBooks |
| 776 08 - ADDITIONAL PHYSICAL FORM ENTRY | |
| Display text | Printed edition: |
| International Standard Book Number | 9781441999450 |
| 856 40 - ELECTRONIC LOCATION AND ACCESS | |
| Uniform Resource Identifier | http://dx.doi.org/10.1007/978-1-4419-9946-7 |
| 912 ## - | |
| -- | ZDB-2-ENG |
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