Soft Errors in Modern Electronic Systems (Record no. 105671)

000 -LEADER
fixed length control field 03781nam a22005055i 4500
001 - CONTROL NUMBER
control field 978-1-4419-6993-4
003 - CONTROL NUMBER IDENTIFIER
control field DE-He213
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20140220083722.0
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr nn 008mamaa
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 100927s2011 xxu| s |||| 0|eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9781441969934
-- 978-1-4419-6993-4
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.1007/978-1-4419-6993-4
Source of number or code doi
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number TK7888.4
072 #7 - SUBJECT CATEGORY CODE
Subject category code TJFC
Source bicssc
072 #7 - SUBJECT CATEGORY CODE
Subject category code TEC008010
Source bisacsh
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.3815
Edition number 23
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Nicolaidis, Michael.
Relator term editor.
245 10 - TITLE STATEMENT
Title Soft Errors in Modern Electronic Systems
Medium [electronic resource] /
Statement of responsibility, etc edited by Michael Nicolaidis.
264 #1 -
-- Boston, MA :
-- Springer US :
-- Imprint: Springer,
-- 2011.
300 ## - PHYSICAL DESCRIPTION
Extent XVIII, 318 p.
Other physical details online resource.
336 ## -
-- text
-- txt
-- rdacontent
337 ## -
-- computer
-- c
-- rdamedia
338 ## -
-- online resource
-- cr
-- rdacarrier
347 ## -
-- text file
-- PDF
-- rda
490 1# - SERIES STATEMENT
Series statement Frontiers in Electronic Testing,
International Standard Serial Number 0929-1296 ;
Volume number/sequential designation 41
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note Soft Errors from Space to Ground: Historical Overview, Empirical Evidence, and Future Trends -- Radiation Induced Single-Event Effects: Physical Mechanisms and Classification -- JEDEC Standard on Measurement and Reporting of Alpha Particles and Terrestrial Cosmic Ray-Induced Soft Errors -- Cell-Level Modelling and Simulation -- Circuit and System Level Modelling and Simulation -- Hardware Fault Injection -- Accelerated Radiation Testing for Space Applications -- Testing for Ground-Level Applications -- Soft Error Mitigation Techniques -- Convergence of Mitigation Techniques for Soft Errors and Other Reliability Issues and Power Aware Mitigation Techniques -- Software Level Soft-Error Mitigation Techniques -- System Level Soft-Error Mitigation Techniques.
520 ## - SUMMARY, ETC.
Summary, etc Soft Errors in Modern Electronic Systems describes the state-of-the-art developments and open issues in the field of soft errors. This work not only highlights a comprehensive presentation of soft errors related issues and challenges but also presents the most efficient solutions, methodologies and tools. The eleven chapters written by highly qualified experts provide a comprehensive description of the complex chain of the physical processes leading to the occurrence of soft errors, as well as of the numerous techniques and tools enabling the SER qualification of electronic systems during the design phase and after production, including: nuclear reactions of cosmic rays with the atmosphere (neutron and proton generation at ground level); nuclear reactions of atmospheric neutrons and protons with die atoms (secondary particles generation); coulomb interaction (ionization); device physics (charge collection); electrical simulation; event driven simulation; logic domain simulation; RTL simulation; hardware emulation, and radiation testing. The book also provides a comprehensive description of various hardware and software techniques enabling soft-error mitigation at moderate cost. Soft Errors in Modern Electronic Systems is a useful book for circuit and system designers, researchers, students and professors.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Engineering.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Operating systems (Computers).
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Computer system performance.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Computer engineering.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Systems engineering.
650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Engineering.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Circuits and Systems.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element System Performance and Evaluation.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Performance and Reliability.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Electrical Engineering.
710 2# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element SpringerLink (Online service)
773 0# - HOST ITEM ENTRY
Title Springer eBooks
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Display text Printed edition:
International Standard Book Number 9781441969927
830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE
Uniform title Frontiers in Electronic Testing,
-- 0929-1296 ;
Volume number/sequential designation 41
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier http://dx.doi.org/10.1007/978-1-4419-6993-4
912 ## -
-- ZDB-2-ENG

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