Fultz, Brent.
Transmission Electron Microscopy and Diffractometry of Materials [electronic resource] / by Brent Fultz, James M. Howe. - Third Edition. - Berlin, Heidelberg : Springer Berlin Heidelberg, 2008. - digital.
9783540738862
10.1007/978-3-540-73886-2 doi
Chemistry.
Particles (Nuclear physics).
Crystallography.
Surfaces (Physics).
Chemistry.
Characterization and Evaluation of Materials.
Surfaces and Interfaces, Thin Films.
Crystallography.
Solid State Physics and Spectroscopy.
Physics and Applied Physics in Engineering.
Transmission Electron Microscopy and Diffractometry of Materials [electronic resource] / by Brent Fultz, James M. Howe. - Third Edition. - Berlin, Heidelberg : Springer Berlin Heidelberg, 2008. - digital.
9783540738862
10.1007/978-3-540-73886-2 doi
Chemistry.
Particles (Nuclear physics).
Crystallography.
Surfaces (Physics).
Chemistry.
Characterization and Evaluation of Materials.
Surfaces and Interfaces, Thin Films.
Crystallography.
Solid State Physics and Spectroscopy.
Physics and Applied Physics in Engineering.