Li, Flora M.
CCD Image Sensors in Deep-Ultraviolet Degradation Behavior and Damage Mechanisms / [electronic resource] : by Flora M. Li, Arokia Nathan. - Berlin, Heidelberg : Springer Berlin Heidelberg, 2005. - digital. - Microtechnology and Mems, 1615-8326 . - Microtechnology and Mems, .
9783540274124
10.1007/b139047 doi
Chemistry.
Spectrum analysis.
Electronics.
Optical materials.
Chemistry.
Optical and Electronic Materials.
Optical Spectroscopy, Ultrafast Optics.
Physics and Applied Physics in Engineering.
Electronics and Microelectronics, Instrumentation.
CCD Image Sensors in Deep-Ultraviolet Degradation Behavior and Damage Mechanisms / [electronic resource] : by Flora M. Li, Arokia Nathan. - Berlin, Heidelberg : Springer Berlin Heidelberg, 2005. - digital. - Microtechnology and Mems, 1615-8326 . - Microtechnology and Mems, .
9783540274124
10.1007/b139047 doi
Chemistry.
Spectrum analysis.
Electronics.
Optical materials.
Chemistry.
Optical and Electronic Materials.
Optical Spectroscopy, Ultrafast Optics.
Physics and Applied Physics in Engineering.
Electronics and Microelectronics, Instrumentation.