Cullis, A. G.
Microscopy of Semiconducting Materials 2007 [electronic resource] / edited by A. G. Cullis, P. A. Midgley. - Dordrecht : Springer Netherlands, 2008. - digital. - Springer Proceedings in Physics, 120 0930-8989 ; . - Springer Proceedings in Physics, 120 .
9781402086151
10.1007/978-1-4020-8615-1 doi
Materials.
Weights and measures.
Particles (Nuclear physics).
Electronics.
Material Science.
Materials Science, general.
Solid State Physics and Spectroscopy.
Measurement Science, Instrumentation.
Electronics and Microelectronics, Instrumentation.
TA401-492
620.11
Microscopy of Semiconducting Materials 2007 [electronic resource] / edited by A. G. Cullis, P. A. Midgley. - Dordrecht : Springer Netherlands, 2008. - digital. - Springer Proceedings in Physics, 120 0930-8989 ; . - Springer Proceedings in Physics, 120 .
9781402086151
10.1007/978-1-4020-8615-1 doi
Materials.
Weights and measures.
Particles (Nuclear physics).
Electronics.
Material Science.
Materials Science, general.
Solid State Physics and Spectroscopy.
Measurement Science, Instrumentation.
Electronics and Microelectronics, Instrumentation.
TA401-492
620.11