Zhou, Weilie.
Scanning Microscopy for Nanotechnology Techniques and Applications / [electronic resource] : edited by Weilie Zhou, Zhong Lin Wang. - New York, NY : Springer New York, 2007. - digital.
9780387396200
10.1007/978-0-387-39620-0 doi
Chemistry.
Optical materials.
Nanotechnology.
Surfaces (Physics).
Chemistry.
Nanotechnology.
Characterization and Evaluation of Materials.
Optical and Electronic Materials.
Measurement Science and Instrumentation.
T174.7 TA418.9.N35
620.115
Scanning Microscopy for Nanotechnology Techniques and Applications / [electronic resource] : edited by Weilie Zhou, Zhong Lin Wang. - New York, NY : Springer New York, 2007. - digital.
9780387396200
10.1007/978-0-387-39620-0 doi
Chemistry.
Optical materials.
Nanotechnology.
Surfaces (Physics).
Chemistry.
Nanotechnology.
Characterization and Evaluation of Materials.
Optical and Electronic Materials.
Measurement Science and Instrumentation.
T174.7 TA418.9.N35
620.115